Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1542207 | Optics Communications | 2006 | 6 Pages |
Abstract
We demonstrated a technique that employs time of flight by transient absorption to measure the temperature of a dark SPOT and a self-induced dark MOT. Our technique is called single parameter transient absorption. It only requires the observation of the absorption transient of a weak light beam during the free expansion of the atom cloud. The obtained temperature is compared with the usual Time of Flight technique showing good agreement. In the two trapping conditions investigated, the temperatures are similar. This fact reinforces the self-induced dark MOT technique as a good alternative to reach high density MOT.
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Physical Sciences and Engineering
Materials Science
Electronic, Optical and Magnetic Materials
Authors
R.R. Silva, K.M.F. Magalhães, E.A.L. Henn, L.G. Marcassa, V.S. Bagnato,