| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1542807 | Optics Communications | 2006 | 5 Pages |
Abstract
A new kind of scanning probe microscope is introduced in this paper, which is a combination of atomic force microscope and reflection scanning near field optical microscopy (AF/RSNOM) with equi-amplitude tapping mode. The principle and recent experiment result of AF/RSNOM are reported. Besides convenient operation, the bi-functional probe tip of AF/RSNOM brings an even illumination for every sampling position. Experiment result and analysis show that the signal to noise ratio (SNR) of AF/RSNOM optical image is much better than that of other RSNOM without tapping working mode.
Related Topics
Physical Sciences and Engineering
Materials Science
Electronic, Optical and Magnetic Materials
Authors
Yinli Li, Shifa Wu, Pengfei Li, Jian Zhang, Shi Pan,