| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1542840 | Optics Communications | 2006 | 5 Pages |
Abstract
A technique for low cost and high precision characterization of fiber Bragg gratings based structures, using transversal pressure, is presented. It is based on the analysis of the amplitude and wavelength changes of the structure reflection spectrum, while being precisely pressed by an electromechanically actuated arm. The theory and the experimental results, which are in good agreement with the expected ones, are also presented.
Related Topics
Physical Sciences and Engineering
Materials Science
Electronic, Optical and Magnetic Materials
Authors
R.N. Nogueira, I. Abe, A.J. Fernandes, H.J. Kalinowski, J.R.F. da Rocha, J.L Pinto,