Article ID Journal Published Year Pages File Type
1542866 Optics Communications 2006 7 Pages PDF
Abstract

Single-shot laser damage threshold of MgO for 40–986 fs, 800 nm laser pulses is reported. The pump–probe measurements with femtosecond pulses were carried out to investigate the time-resolved electronic excitation processes. A theoretical model including conduction band electrons (CBE) production and laser energy deposition was applied to discuss the roles of multiphoton ionization (MPI) and avalanche ionization in femtosecond laser-induced dielectric breakdown. The results indicate that avalanche ionization plays the dominant role in the femtosecond laser-induced breakdown in MgO near the damage threshold.

Related Topics
Physical Sciences and Engineering Materials Science Electronic, Optical and Magnetic Materials
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