Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1542866 | Optics Communications | 2006 | 7 Pages |
Abstract
Single-shot laser damage threshold of MgO for 40–986 fs, 800 nm laser pulses is reported. The pump–probe measurements with femtosecond pulses were carried out to investigate the time-resolved electronic excitation processes. A theoretical model including conduction band electrons (CBE) production and laser energy deposition was applied to discuss the roles of multiphoton ionization (MPI) and avalanche ionization in femtosecond laser-induced dielectric breakdown. The results indicate that avalanche ionization plays the dominant role in the femtosecond laser-induced breakdown in MgO near the damage threshold.
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Materials Science
Electronic, Optical and Magnetic Materials
Authors
S.Z. Xu, T.Q. Jia, H.Y. Sun, C.B. Li, X.X. Li, D.H. Feng, J.R. Qiu, Z.Z. Xu,