Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1543086 | Photonics and Nanostructures - Fundamentals and Applications | 2008 | 6 Pages |
Abstract
An accurate methodology is presented to measure photonic crystal emissivity using a direct method. This method addresses the issue of how to separate the emissions from the photonic crystal and the substrate. The method requires measuring two quantities: the total emissivity of the photonic crystal–substrate system, and the emissivity of the substrate alone. Our measurements have an uncertainty of 4% and represent the most accurate measure of a photonic crystal's emissivity. The measured results are compared to, and agree very well with, the independent emitter model.
Related Topics
Physical Sciences and Engineering
Materials Science
Electronic, Optical and Magnetic Materials
Authors
T.S. Luk, T. Mclellan, G. Subramania, J.C. Verley, I. El-Kady,