| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1543141 | Photonics and Nanostructures - Fundamentals and Applications | 2007 | 8 Pages |
Abstract
We show that the sensitivity to disorder of certain physical properties of periodic media depends on whether the disorder is truly random or not. This allows to utilize periodic media for testing sequences of random numbers and to quantify their departure from true randomness via simple transmission and/or reflection data analysis. This physics-based model shows promises for device applications to test random data.
Related Topics
Physical Sciences and Engineering
Materials Science
Electronic, Optical and Magnetic Materials
Authors
Alain Haché, Mohit Malik, Marcus Diem, Lasha Tkeshelashvili, Kurt Busch,