| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1544462 | Physica E: Low-dimensional Systems and Nanostructures | 2015 | 5 Pages |
•CdS thin film by SILAR.•Noncarbon and nonsodium containing anionic precursor.•Cubic structure from XRD and SAED patterns.•Shift in band gap energy value indicating quantum confinement.
Cadmium sulphide (CdS) thin film was prepared by successive ion layer adsorption and reaction (SILAR) technique using ammonium sulphide as anionic precursor. Characterization techniques of XRD, SEM, TEM, FTIR and EDX were utilized to study the microstructure of the films. Structural characterization by x-ray diffraction reveals the polycrystalline nature of the films. Cubic structure is revealed from X-ray diffraction and selected area diffraction (SAD) patterns. The particle size estimated using X-ray line broadening method is approximately 7 nm. Instrumental broadening was taken into account while particle size estimation. TEM shows CdS nanoparticles in the range 5–15 nm. Elemental mapping using EFTEM reveals good stoichiometric composition of CdS. Characteristic stretching vibration mode of CdS was observed in the absorption band of FTIR spectrum. Optical absorption study exhibits a distinct blue shift in band gap energy value of about 2.56 eV which confirms the size quantization.
