| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1544878 | Physica E: Low-dimensional Systems and Nanostructures | 2012 | 4 Pages |
Electrostatic properties, quantum capacitance (Cq) and local density of states (LDOS) are evaluated for graphene on 4H-SiC(0 0 0 1) by measuring the local capacitance with Scanning Capacitance Spectroscopy (SCS). Two distinct samples were used for comparative study, viz., graphene exfoliated and deposited on 4H-SiC(0 0 0 1)—DG, and graphene grown epitaxially on 4H-SiC(0 0 0 1)—EG. We observed a distinctly lower screening length (rscr) and Cq while wider variations in the LDOS for EG. Such differences are attributed to the peculiar interface between EG/4H-SiC(0 0 0 1), which is known to be more or less defective having the presence of positive charges.
Research highlights► Local electrostatic properties are evaluated for graphene on 4H-SiC(0 0 0 1). ► Lower screening length and Cq are observed for epitaxial graphene on 4H-SiC(0 0 0 1). ► Such differences are attributed to the peculiar interface between EG/4H-SiC(0 0 0 1). ► The results are compared with graphene deposited on 4H-SiC(0 0 0 1).
