Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1545818 | Physica E: Low-dimensional Systems and Nanostructures | 2010 | 4 Pages |
Abstract
We report on measurements of single electron tunneling through a quantum dot using a quantum point contact as non-invasive charge detector with fast time response. We elaborate on the unambiguous identification of individual tunneling events and determine the distribution of transferred charges, the so-called full counting statistics. We discuss our data analysis, including the error estimates of the measurement, and show that the quality of our experimental results is sufficiently high to extract cumulants of the distribution up to the 20th order for short times.
Related Topics
Physical Sciences and Engineering
Materials Science
Electronic, Optical and Magnetic Materials
Authors
Christian Fricke, Frank Hohls, Christian Flindt, Rolf J. Haug,