| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1547695 | Physica E: Low-dimensional Systems and Nanostructures | 2007 | 4 Pages |
Abstract
Current-voltage and noise characteristics of porous silicon (PS)/single crystalline silicon (SCS) samples were measured under exposure to dry air, air +0.4% CO, dry air +1.7% CO, and dry air+ethyl alcohol vapor. The samples have a sandwich structure comprising Al/PS/SCS/Al. For the dry air +CO mixtures, the noise level was sensitive not only to the presence of CO but also to its percentage, and an increase of the CO concentration led to a change in the spectral density function of the low-frequency noise.
Related Topics
Physical Sciences and Engineering
Materials Science
Electronic, Optical and Magnetic Materials
Authors
Z.H. Mkhitaryan, A.A. Shatveryan, V.M. Aroutiounian, M. Ghulinyan, L. Pavesi, L.B. Kish, C.G. Granqvist,