Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1547900 | Physica E: Low-dimensional Systems and Nanostructures | 2007 | 5 Pages |
Abstract
The photoluminescence (PL) of Mn-implanted quantum dot (QD) samples after rapid annealing is studied. It is found that the blue shift of the PL peak of the QDs, introduced by the rapid annealing, decreases abnormally as the implantation dose increases. This anomaly is probably related to the migration of Mn atoms to the InAs QDs during annealing, which leads to strain relaxation when Mn atoms enter InAs QDs or to the suppression of the inter-diffusion of In and Ga atoms when Mn atoms surround QDs. Both effects will suppress the blue shift of the QD PL peaks. The temperature dependence of the PL intensity of the heavily implanted QDs confirms the existence of defect traps around the QDs.
Keywords
Related Topics
Physical Sciences and Engineering
Materials Science
Electronic, Optical and Magnetic Materials
Authors
L.J. Hu, Y.H. Chen, X.L. Ye, X.Q. Huang, L.Y. Liang, F. Ding, Z.G. Wang,