Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1547949 | Physica E: Low-dimensional Systems and Nanostructures | 2006 | 4 Pages |
Abstract
The Raman spectra of silicon nanoparticles in the size range between d=3.5d=3.5–60nm have been studied experimentally. Scattering processes up to second order are being observed. The experimental results are analyzed in the framework of the phonon confinement model. While this model describes qualitatively the observations for first-order scattering processes, it is not applicable for scattering processes of higher order. From the analysis of second-order scattering, we determine a redshift of the TO phonon at the X and L points.
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Electronic, Optical and Magnetic Materials
Authors
Cedrik Meier, Stephan Lüttjohann, Vasyl G. Kravets, Hermann Nienhaus, Axel Lorke, Hartmut Wiggers,