Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1548432 | Progress in Natural Science: Materials International | 2013 | 13 Pages |
Abstract
The outstanding merits of scanning transmission electron tomography as a technique for the investigation of the internal structure and morphology of nanoparticle and nanocluster materials are summarized with the aid of numerous typical illustrations. Reference is made also to the significant advances that have arisen in probing ultrastructural characteristics of nanoscale solids using aberration-corrected (AC) electron microscopy (EM). Information of a unique kind may be retrieved by combining the imaging and analytical power of ACEM.
Keywords
Related Topics
Physical Sciences and Engineering
Materials Science
Electronic, Optical and Magnetic Materials
Authors
John Meurig Thomas, Paul A. Midgley, Caterina Ducati, Rowan K. Leary,