Article ID Journal Published Year Pages File Type
1553242 Superlattices and Microstructures 2015 11 Pages PDF
Abstract

•A new approach to solving the phase problem for X-ray specular reflectivity is proposed.•An iterative Levenberg–Marquardt algorithm is used to solve the nonlinear Fredholm integral equation.•Effectiveness of the proposed method was tested by numerical experiments for the thin film.•We compare the results obtained for the Cr film experimental data using different approaches.

A new approach to solving the phase problem for X-ray specular reflectivity is proposed. An iterative algorithm is used to solve the nonlinear Fredholm integral equation describing the intensity of the X-rays reflection from the sample surface and to determine the concentration depth-profile of element. Effectiveness of the proposed method was tested by numerical experiments for the thin film. We compare the results obtained for the Cr film experimental data using the Parratt model, phaseless inverse scattering method (logarithmic dispersion relations), and the proposed method.

Related Topics
Physical Sciences and Engineering Materials Science Electronic, Optical and Magnetic Materials
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