| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1554058 | Superlattices and Microstructures | 2011 | 10 Pages |
Ti-doped ZnO (ZnO:Ti) thin films were deposited on the glass and Si substrates using radio frequency reactive magnetron sputtering. The effects of substrate on the microstructures and optical properties of ZnO:Ti thin films were investigated by X-ray diffraction (XRD), scanning electron microscopy (SEM) and a fluorescence spectrophotometer. The structural analyses of the films indicated that they were polycrystalline and had a hexagonal wurtzite structure on different substrates. When ZnO:Ti thin film was deposited on Si substrate, the film had a c-axis preferred orientation, while preferred orientation of ZnO:Ti thin film deposited on glass substrate changed towards (1 0 0). Finally, we discussed the influence of the oxygen partial pressures on the structural and optical properties of glass-substrate ZnO:Ti thin films. At a high ratio of O2:Ar of 18:10 sccm, the intensity of (0 0 2) diffraction peak was stronger than that of (1 0 0) diffraction peak, which indicated that preferred orientation changed with the increase of O2:Ar ratios. The average optical transmittance with over 93% in the visible range was obtained independent of the O2:Ar ratio. The photoluminescence (PL) spectra measured at room temperature revealed four main emission peaks located at 428, 444, 476 and 527 nm. Intense blue-green luminescence was obtained from the sample deposited at a ratio of O2:Ar of 14:10 sccm. The results showed that the oxygen partial pressures had an important influence for PL spectra and the origin of these emissions was discussed.
► ZnO:Ti films had a hexagonal wurtzite structure at different substrates. ► When ZnO:Ti thin film was deposited on Si substrate, film had a c-axis preferred orientation. ► The (0 0 2) orientation of ZnO:Ti/glass film was improved by appropriate oxygen partial pressure. ► Intense blue-green luminescence was obtained from the sample.
