Article ID Journal Published Year Pages File Type
1554353 Superlattices and Microstructures 2009 5 Pages PDF
Abstract

In this paper we present an atomic force microscopy and X-ray photoemission spectroscopy study of the composition and shape evolution of self-assembled Ge/Si(001) islands upon capping with Si. We found that the islands undergo a reverse Straski–Krastanov shape evolution, with a progressive Si-enrichment of both the wetting layer and the islands. We demonstrate that the island shape evolves at constant volume with silicon atom incorporation occurring in the absence of lateral diffusion of Ge and Si atoms from the wetting layer to the islands themselves.

Related Topics
Physical Sciences and Engineering Materials Science Electronic, Optical and Magnetic Materials
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