Modeling and analysis of fully strained and partially relaxed lattice mismatched AlGaN/GaN HEMT for high temperature applications

The paper presents an accurate charge control model for a fully strained (FS), and partially relaxed (PR) lattice mismatched AlGaN/GaN HEMT, taking into consideration the effect of spontaneous and piezoelectric polarization. The model also accounts for the mobility degradation with increase in temperature, which is one of the major causes in deterioration of the driving current. By using the variation of band gap with temperature, the temperature dependence on threshold voltage, sheet carrier concentration and drain current is studied. Further, the temperature variation shows the applicability of the device in a variable thermal environment. A close agreement of calculated data with simulated/experimental data proves the validity of the model.