Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1554738 | Superlattices and Microstructures | 2008 | 8 Pages |
Abstract
Thin films of zinc oxide have been deposited onto (0001) sapphire substrate by sol–gel and spin-coating methods. The XRD pattern showed that the crystallinity of the annealed ZnO films had improved in comparison with that of the as-grown films. Photoluminescence spectra revealed a two-line structure, which is identified in terms of UV emission and defect-related emission. The emission intensity was found to be greatly dependent on heat treatment. Host phonons of ZnO and a shift of the E2E2 (high) peak from its position have been observed from Raman spectra. The surface morphologies of the film had been improved after annealing was observed from AFM images.
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Authors
G. Srinivasan, N. Gopalakrishnan, Y.S. Yu, R. Kesavamoorthy, J. Kumar,