Modelling of stresses evolution in growing thermal oxides on metals. A methodology to identify the corresponding mechanical parameters

In the present work, mechanical features of different thermal oxide films growing on metals have been investigated at different temperatures. An adapted model is performed to describe the stresses evolution within the oxide films. These predictions are compared with experimental results obtained by different experimental techniques. In order to obtain some accurate mechanical characteristic parameters of the system, both an asymptotic approach and an optimization procedure have been developed and presented through a general methodology. In respect to the chosen assumptions, the present model enables to give a precise mechanical description of each considered layer.

► Analytical relations are used to determine material characteristics. ► A specific modelling of the mechanical fields within the oxide is done. ► Relaxation and growth parameters are identified from an inverse method. ► Methodology is performed for several oxides growing on metallic alloys.