| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1562876 | Computational Materials Science | 2010 | 5 Pages |
Abstract
The evolution of the giant magnetoresistance (GMR) effect in thin film multilayers based on (Co/Cu)n has been investigated by using semi-classical approach of the two spin channel currents developed by Hood, Falicov and Penn. The in plane MR of Co/Cu multilayers is calculated for correlated quasiperiodic interfaces. The numerical results show important influence of interface roughness on the behaviour of MR. The variation of MR with phenomenological parameters Sâ and Sâ for two directions of spin and relaxation time is reported. This interface roughness has been successfully included in our GMR simulation using a semi-classical description to analyse the experimental results giving the variation of MR with the thickness of the copper interlayer.
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Authors
B. Elsafi, F. Trigui, Z. Fakhfakh,