| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1571167 | Materials Characterization | 2013 | 5 Pages |
Abstract
We report a new kind of artifact observed in the preparation of a TEM sample of zirconia by FIB, which consists in the deposition of metallic gallium nano-dots on the TEM sample surface. High resolution TEM images showed a microstructure of fine equiaxed grains of ~Â 5Â nm, with some of them possessing two particular characteristics: high contrast and well-defined fast Fourier transform. These grains could not be identified as any phase of zirconia but it was possible to identify them as gallium crystals in the zone axis [110]. Based on HRTEM simulations, the possible orientations between zirconia substrate and deposited gallium are discussed in terms of lattice mismatch and oxygen affinity.
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Physical Sciences and Engineering
Materials Science
Materials Science (General)
Authors
J.A. Muñoz-Tabares, M. Anglada, J. Reyes-Gasga,