| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1571207 | Materials Characterization | 2013 | 6 Pages |
Abstract
High temperature X-ray diffraction (HT-XRD) and Rietveld refinement of Li1.5Al0.5Ge1.5(PO4)3 (LAGP) glass-ceramics were recorded to investigate the phase transformation, cell parameters and the mass fraction of each crystal phase, which occur in the glass to glass-ceramics process during different crystallization temperatures. The relationship between the average grain size and conductivity that originate from and relate to the crystallization temperature was analyzed by SEM micrograph and AC impedance spectroscopy.
Related Topics
Physical Sciences and Engineering
Materials Science
Materials Science (General)
Authors
He Kun, Wang Yanhang, Zu Chengkui, Liu Yonghua, Zhao Huifeng, Chen Jiang, Han Bin, Ma Juanrong,