| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1571236 | Materials Characterization | 2013 | 15 Pages |
Abstract
⺠Measurement of the γ/γⲠlattice mismatch (δ) using three techniques (TEM, SEM, XRD) ⺠Post-mortem techniques (SEM/TEM) = measurement of the last high temperature δ. ⺠Post-mortem techniques insensitive to the regularity of the interfacial network ⺠δ is sensitive to the whole thermomechanical history.
Related Topics
Physical Sciences and Engineering
Materials Science
Materials Science (General)
Authors
Laura Dirand, Jonathan Cormier, Alain Jacques, Jean-Philippe Chateau-Cornu, Thomas Schenk, Olivier Ferry, Pierre Bastie,