| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1571309 | Materials Characterization | 2012 | 7 Pages |
Abstract
Electron energy-loss spectroscopy (EELS) in the transmission electron microscope (TEM) has become widely used for the analysis of the composition and electronic structure of materials at the nanoscale. This tutorial review provides an overview of the theory and applications of the technique and a few examples are provided to illustrate the type of information available. Some of the recent developments and future prospects of EELS are discussed.
Related Topics
Physical Sciences and Engineering
Materials Science
Materials Science (General)
Authors
V.J. Keast,