Article ID Journal Published Year Pages File Type
1571390 Materials Characterization 2012 9 Pages PDF
Abstract
► Multiscale characterization by X-ray synchrotron and focused ion beam tomography. ► Characterized microstructural features in several Sn-based alloys. ► Quantified size, fraction, and clustering of microstructural features.
Keywords
Related Topics
Physical Sciences and Engineering Materials Science Materials Science (General)
Preview
Multiscale microstructural characterization of Sn-rich alloys by three dimensional (3D) X-ray synchrotron tomography and focused ion beam (FIB) tomography
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