| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1571677 | Materials Characterization | 2010 | 10 Pages |
Abstract
In this paper, atomic force microscopy (AFM) is used to quantitatively characterize the plastic glide occurring during tensile deformation of a duplex 2205 stainless steel sample. We demonstrate that an appropriate treatment of the topographic image issued from AFM measurements allows precise and quantitative information about the characteristics of plastic deformation and especially the amount of crystallographic slip.
Related Topics
Physical Sciences and Engineering
Materials Science
Materials Science (General)
Authors
C. Kahloun, R. Badji, B. Bacroix, M. Bouabdallah,