Article ID Journal Published Year Pages File Type
1571758 Materials Characterization 2010 6 Pages PDF
Abstract

Deformation-induced α2 → γ phase transformation in high Nb containing TiAl alloys was investigated using high-resolution transmission electron microscopy (HREM) and energy dispersive X-ray spectroscopy (EDS). The dislocations appearing at the tip of deformation-induced γ plate (DI-γ) and the stacking sequence change of the α2 matrix were two key evidences for determining the occurrence of the deformation-induced α2 → γ phase transformation. Compositional analysis revealed that the product phase of the room-temperature transformation was not standard γ phase; on the contrary, the product phase of the high-temperature transformation was standard γ phase.

Related Topics
Physical Sciences and Engineering Materials Science Materials Science (General)
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