Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1571762 | Materials Characterization | 2010 | 5 Pages |
Abstract
Different model based approaches of X-ray diffraction line profile analysis have been applied on the heavily deformed zirconium-based alloys in the powdered form to characterize the microstructural parameters like domain size, microstrain and dislocation density. In characterizing the microstructure of the material, these methods are complimentary to each other. Though the parameters obtained by different techniques are differently defined and thus not necessarily comparable, the values of domain size and microstrain obtained from the different techniques show similar trends.
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Physical Sciences and Engineering
Materials Science
Materials Science (General)
Authors
P.S. Chowdhury, A. Sarkar, P. Mukherjee, N. Gayathri, M. Bhattacharya, P. Barat,