Article ID Journal Published Year Pages File Type
1571762 Materials Characterization 2010 5 Pages PDF
Abstract
Different model based approaches of X-ray diffraction line profile analysis have been applied on the heavily deformed zirconium-based alloys in the powdered form to characterize the microstructural parameters like domain size, microstrain and dislocation density. In characterizing the microstructure of the material, these methods are complimentary to each other. Though the parameters obtained by different techniques are differently defined and thus not necessarily comparable, the values of domain size and microstrain obtained from the different techniques show similar trends.
Related Topics
Physical Sciences and Engineering Materials Science Materials Science (General)
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