Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1571822 | Materials Characterization | 2009 | 9 Pages |
Abstract
A comparison is made between the measured α/β phase fractions in Ti-6246 using X-ray diffraction (XRD) and electron microscopy. Image analysis of SEM and TEM images was compared to the phase fraction estimate obtained using electron backscattered diffraction, lab and high-energy synchrotron XRD. There was a good agreement between the electron microscopic and diffraction techniques, provided that the microstructural parameters of grain size and texture are estimated correctly when using quantitative Rietveld refinement.
Related Topics
Physical Sciences and Engineering
Materials Science
Materials Science (General)
Authors
M.M. Attallah, S. Zabeen, R.J. Cernik, M. Preuss,