| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1572261 | Materials Characterization | 2007 | 4 Pages |
Abstract
This paper concerns the method on how to prepare TEM samples for the films deposited on metallic substrates. This method is described in a step-by-step way and applied to the VN/SiO2 superlattice to testify to its feasibility in the second part.
Keywords
Related Topics
Physical Sciences and Engineering
Materials Science
Materials Science (General)
Authors
Yan Liu, Ruobin Wang, Xinqiu Guo, Jiawei Dai,