| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1572764 | Materials Characterization | 2008 | 6 Pages |
Abstract
Critical comparison of transmission electron microscopy and atomic force microscopy techniques was provided concerning size measurements of γ' precipitates in a nickel-base superalloy. The divergence between results is explained in terms of the resolution limit for atomic force microscopy, linked both to the tip dimension and the diameter of the investigated particles.
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Physical Sciences and Engineering
Materials Science
Materials Science (General)
Authors
M. Risbet, X. Feaugas, C. Guillemer-Neel, M. Clavel,