| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1572858 | Materials Characterization | 2008 | 4 Pages |
Abstract
Nd:YVO4 thin films have been grown on silica glass substrates by using pulsed laser deposition technique. X-ray diffraction results show that the as-deposited Nd:YVO4 film is basically oriented polycrystalline and strong (200) peak was revealed. X-ray photoelectron spectroscopy measurements show that valence state of elements of prepared films is consistent with that of bulk target material. Prism coupling technique measurement shows that both TE and TM mode reveal sharp drops at some angular positions, indicating favorable light confinements within the Nd:YVO4 waveguide layer. The surface morphology of the deposited Nd:YVO4 films was also observed by using atomic force microscopy.
Related Topics
Physical Sciences and Engineering
Materials Science
Materials Science (General)
Authors
Hongxia Li, Xin Wu, Renguo Song,