Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1572973 | Materials Characterization | 2007 | 5 Pages |
Abstract
The effect of boron on the microstructure of a near-eutectic Al–Si alloy (ZL109) was investigated by scanning electron microscopy (SEM) and electron beam microprobe analysis (EPMA). It was found that α-Al dendrites and eutectic clusters were significantly refined by the addition of boron. Another interesting discovery is that the near-eutectic alloy exhibited hypereutectic structure characteristics when the level of boron added exceeds 0.3%, i.e., primary Si is precipitated in the eutectic microstructure. A new type of nucleation substrate for the primary Si is found, AlxCamBnSi. This appears to be the main reason for the precipitation of primary Si.
Related Topics
Physical Sciences and Engineering
Materials Science
Materials Science (General)
Authors
Wu Yuying, Liu Xiangfa, Bian Xiufang,