Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1574931 | Materials Science and Engineering: A | 2014 | 4 Pages |
Abstract
We used a contact-mode atomic force microscopy (AFM) to study the mechanical properties of an individual ZnO nanowire in the open air. It is noteworthy that the Young׳s modulus can be determined by an AFM tip compressing a single nanowire on a rigid substrate, which can bring more repeatability and accuracy for the measurements. In particular, the calculated radial Young׳s modulus of ZnO nanowires is consistent with the data of ZnO bulks and thin films. We also present the Young׳s modulus with different diameters, and all these are discussed deeply.
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Physical Sciences and Engineering
Materials Science
Materials Science (General)
Authors
Dayong Jiang, Chunguang Tian, Qingfei Liu, Man Zhao, Jieming Qin, Jianhua Hou, Shang Gao, Qingcheng Liang, Jianxun Zhao,