Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1575096 | Materials Science and Engineering: A | 2014 | 6 Pages |
Abstract
The interrupted creep tests (ε=0.1%) of a fourth and a sixth generation Ni-base single crystals, i.e. MX-4/PWA 1497 and TMS-238, were conducted at 800 °C and 735 MPa along [001]. TMS-238 had a creep time more than sixty times longer than MX-4/PWA 1497. Microstructural observations showed that stacking faults (SFs) sheared both the γ matrix and γ΄ precipitates in MX-4/PWA 1497, however, SFs sheared only the γ matrix in TMS-238. The factors that affect the creep deformation are discussed. The results imply that the stacking fault energy (SFE) of γ matrix in TMS-238 is lower than that in MX-4. Higher additions of Re and Ru are responsible for the lower SFE in TMS-238.
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Authors
Y. Yuan, K. Kawagishi, Y. Koizumi, T. Kobayashi, T. Yokokawa, H. Harada,