Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1577143 | Materials Science and Engineering: A | 2012 | 6 Pages |
Abstract
⺠The annealing process of NiTi wires was studied using DSC analysis and in situ electrical resistance measurement. ⺠The effect of different cold drawn values on recovery and recrystallization processes was investigated. ⺠Annealing of highly cold drawn sample at 450 °C results in formation of nano-subgrains in structure. ⺠Regarding to DSC analysis, recrystallization starts at above 560 °C for different cold drawn samples. ⺠Subgrains coarsening occur in highly cold drawn samples during annealing at 550 °C.
Related Topics
Physical Sciences and Engineering
Materials Science
Materials Science (General)
Authors
Kamel Kazemi-Choobi, Jafar Khalil-Allafi, Vahid Abbasi-Chianeh,