| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1577712 | Materials Science and Engineering: A | 2012 | 9 Pages |
Abstract
⺠Defect density in the nanopillars was evaluated by synchrotron X-ray diffraction. ⺠Results show the rate of defect generated during compression exceeds annihilation. ⺠A semi-quantitative analytical method was developed to estimate defect density.
Related Topics
Physical Sciences and Engineering
Materials Science
Materials Science (General)
Authors
Arief Suriadi Budiman, Gyuhyon Lee, Michael J. Burek, Dongchan Jang, Seung Min J. Han, Nobumichi Tamura, Martin Kunz, Julia R. Greer, Ting Y. Tsui,