| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1578308 | Materials Science and Engineering: A | 2011 | 6 Pages |
Abstract
⺠Unequal grained nanoscale Cu/Ta multilayers were fabricated. ⺠The hardness and strain rate sensitivity of the multilayers were examined. ⺠A transitional point of strain rate sensitivity was observed. ⺠Deformation mechanism is dependent on both strain rate and grain size. ⺠Dislocation dominates at high strain rate whilst grain boundary dominates at lower.
Related Topics
Physical Sciences and Engineering
Materials Science
Materials Science (General)
Authors
P. Huang, F. Wang, M. Xu, T.J. Lu, K.W. Xu,