| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1578368 | Materials Science and Engineering: A | 2011 | 9 Pages |
Abstract
⺠The dislocation density is determined in Cu and Nb layers by X-ray line broadening. ⺠An X-ray method is applied to always sample the same texture component. ⺠The dislocation density in Cu layers is independent of the layer and total thickness. ⺠The overwhelming majority of Burgers vectors is parallel to the interface. ⺠The strength is modeled on the basis of the substructure data.
Related Topics
Physical Sciences and Engineering
Materials Science
Materials Science (General)
Authors
Gábor Csiszár, Amit Misra, Tamás Ungár,