| Article ID | Journal | Published Year | Pages | File Type | 
|---|---|---|---|---|
| 1578837 | Materials Science and Engineering: A | 2010 | 8 Pages | 
Abstract
												â¶ Adhesion strength of flip chip interconnections using ACF is measured. â¶ Adhesion strength of Si/ACF is weaker than FR4/ACF. â¶ Si/ACF is the crucial region where delamination might occur during service. â¶ Moisture absorption can degrade the intrinsic adhesion property of ACF material.
											Keywords
												
											Related Topics
												
													Physical Sciences and Engineering
													Materials Science
													Materials Science (General)
												
											Authors
												Gi-Dong Sim, Chang-Kyu Chung, Kyung-Wook Paik, Soon-Bok Lee, 
											