Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1579465 | Materials Science and Engineering: A | 2010 | 9 Pages |
Abstract
The size distribution and volume fraction of the γⲠphase in Ni-based superalloys plays a critical role in microstructural evolution and mechanical properties. Automated analysis of images is often desired for rapid quantitative characterization of these microstructures. Backscatter electron imaging of specimens in which the γⲠphase has been selectively etched yields images that can be more readily segmented with image processing algorithms than other imaging techniques. Utilization of this combination of sample preparation and imaging technique allows for the rapid collection of microstructural data.
Related Topics
Physical Sciences and Engineering
Materials Science
Materials Science (General)
Authors
E.J. Payton, P.J. Phillips, M.J. Mills,