| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1579516 | Materials Science and Engineering: A | 2010 | 11 Pages |
Abstract
The microstructure has been characterized applying electron microscopy and microstructural parameters such as fraction of twinned grains, grain size, lamellar distance and dislocation density have been quantified.
Related Topics
Physical Sciences and Engineering
Materials Science
Materials Science (General)
Authors
S.P. Brookes, H.-J. Kühn, B. Skrotzki, H. Klingelhöffer, R. Sievert, J. Pfetzing, D. Peter, G. Eggeler,