| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1579966 | Materials Science and Engineering: A | 2010 | 4 Pages |
Abstract
The dislocation substructure evolution on Al creep under the action of the weak electric potential is established by methods of transmission diffraction electron microscopy. It is shown that change of the electrical potential of the Al sample surface is accompanied by the increase of dislocation substructure self-organization degree.
Related Topics
Physical Sciences and Engineering
Materials Science
Materials Science (General)
Authors
V.E. Gromov, Yu.F. Ivanov, O.A. Stolboushkina, S.V. Konovalov,