| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1580190 | Materials Science and Engineering: A | 2009 | 4 Pages |
Abstract
The oxygen content of binary Ti45Al55 and ternary Ti44Al52Nb4 single crystals and polycrystalline alloys was quantified with secondary ion mass spectrometry (SIMS) using Cs+ primary ions. The SIMS measurements were calibrated with respect to concentration and depth scale using oxygen implanted samples. The measurements revealed considerably lower oxygen content in the ternary alloy indicating a protecting impact of the Nb addition in grain boundaries against oxygen contamination. The relative strong surface oxide layer thickness of the investigated samples was determined to about 1 μm.
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Authors
S. Oswald, R. Hermann, B. Schmidt,