Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1580815 | Materials Science and Engineering: A | 2010 | 7 Pages |
Abstract
A computationally efficient microstructure characterization technique is presented that separately identifies morphological texture and any orientation dependence of second-phase clustering via a concise visual representation. This technique, the Vector Multi-Scale Analysis of Area Fractions (VMSAAF), is then applied to computer-generated microstructures to understand the effects of second-phase area fraction, aspect ratio, alignment propensity, variant orientation, and degree of microstructure banding on the homogenous length scale-a metric used to quantify clustering-as well as the extent of representative volume elements for a microstructure.
Related Topics
Physical Sciences and Engineering
Materials Science
Materials Science (General)
Authors
G.B. Wilks, M.A. Tschopp, J.E. Spowart,