| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1581974 | Materials Science and Engineering: A | 2008 | 7 Pages |
Abstract
The transformation mechanisms of abnormal grain growth in nanocrystalline Ni were studied extensively by transmission electron microscopy (TEM). A combination of in situ TEM annealing and ex situ annealing followed by TEM characterization was used. It was observed that grain boundary migration is both spatially and temporally non-uniform; migration occurs in a series of discrete steps, which are followed by periods of stagnation.
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Physical Sciences and Engineering
Materials Science
Materials Science (General)
Authors
G.D. Hibbard, V. Radmilovic, K.T. Aust, U. Erb,