Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1583649 | Materials Science and Engineering: A | 2007 | 8 Pages |
Abstract
The oxidation of Ti3SiC2 in air from 25 to 1450 °C is characterised by differential thermal and gravimetric analysis (DTA/TGA), X-ray diffraction (XRD), grazing-incidence synchrotron radiation diffraction (GISRD), neutron diffraction (ND), transmission electron microscopy (TEM), secondary ions mass spectroscopy (SIMS) and Vickers indentation. The diffraction results show that rutile formed at a temperature of â¼750 °C. A glassy phase - formed at >1000 °C - devitrified upon cooling to room temperature to form tridymite but crystallised to cristobalite at temperatures â¥Â 1300 °C. Composition depth-profiling of the surface layer oxides by XRD, GISRD and SIMS revealed a graded distribution of phases (TiO2, SiO2 and Ti3SiC2) both at the nanoscale (â¤1100 °C) and microscale level (â¥1200 °C), which is particularly distinct at the interfaces. The oxide layers also exhibit a graded variation in microhardness.
Related Topics
Physical Sciences and Engineering
Materials Science
Materials Science (General)
Authors
I.M. Low, E. Wren, K.E. Prince, A. Atanacio,