Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1588776 | Micron | 2015 | 7 Pages |
Abstract
In the presented work the nanomechanical properties of four different polymer based electrospun fibers were tested using PeakForce Quantitative NanoMechanics atomic force microscopy, with standard and modified scanning probes. Standard, commercially available probes have been modified by etching using focused ion beam (FIB). Results have shown that modified probes can be used for mechanical properties mapping of biomaterial in the nanoscale, and generate nanomechanical information where conventional tips fail.
Related Topics
Physical Sciences and Engineering
Materials Science
Materials Science (General)
Authors
Adrian Chlanda, Janusz Rebis, Ewa KijeÅska, Michal J. Wozniak, Krzysztof Rozniatowski, Wojciech Swieszkowski, Krzysztof J. Kurzydlowski,