| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1589128 | Micron | 2011 | 8 Pages |
Abstract
⺠Spatial resolution of aberration corrected STEM/EELS measured for Ti M2,3, Ti L2,3, V L2,3, Mn L2,3, La N4,5, La N2,3 La M4,5 and Sr L3 edges using oxide superlattices. ⺠EELS signals recorded using large collection angles are peaked at atomic columns. ⺠The FWHM of the EELS profiles agrees with Egerton's empirical delocalization model for Ti, V, and Mn edges in thin samples. ⺠The FWHM of the Sr and La edges is larger than the model's prediction because of scattering by heavy atomic columns.
Keywords
Related Topics
Physical Sciences and Engineering
Materials Science
Materials Science (General)
Authors
A.B. Shah, Q.M. Ramasse, J.G. Wen, A. Bhattacharya, J.M. Zuo,