Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1589215 | Micron | 2012 | 8 Pages |
Abstract
⺠Data from synchrotron X-ray tomography were compared to data from lightmicroscopy and to data from SEM/FIB imaging. ⺠Synchrotron tomographic measurements were performed at five different sample to detector distances allowing for phase contrast enhancements. ⺠A protocol was established allowing to identify a single cell in the tomographic tissue representation and preparing the same cellular structure for histology and image the cell in the same spatial orientation.
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Materials Science (General)
Authors
Rolf Zehbe, Heinrich Riesemeier, C. James Kirkpatrick, Christoph Brochhausen,